Difference between revisions of "Part:BBa K1632000:Experience"
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<strong>Please click [https://parts.igem.org/Part:BBa_K1632002:Experience here]</strong>. (''fim'' switch[default ON](Tokyo_Tech/J23119)_rbs_''gfp'' Experiment Page) | <strong>Please click [https://parts.igem.org/Part:BBa_K1632002:Experience here]</strong>. (''fim'' switch[default ON](Tokyo_Tech/J23119)_rbs_''gfp'' Experiment Page) | ||
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| + | ===More information=== | ||
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| + | For more information, see [[http://2015.igem.org/Team:Tokyo_Tech/Project Our work in Tokyo_Tech 2015 wiki]], [[http://2015.igem.org/Team:Tokyo_Tech/Experiment/ssrA_tag_degradation_assay About ssrA-tag]], [[http://2015.igem.org/Team:Tokyo_Tech/Experiment/Overview_of_fim_inversion_system About ''fim'' inversion system]] | ||
===Applications of BBa_K1632000=== | ===Applications of BBa_K1632000=== | ||
Latest revision as of 23:54, 18 September 2015
Please click here. (fim switch[default ON](Tokyo_Tech/J23119)_rbs_gfp Experiment Page)
More information
For more information, see http://2015.igem.org/Team:Tokyo_Tech/Project Our work in Tokyo_Tech 2015 wiki, http://2015.igem.org/Team:Tokyo_Tech/Experiment/ssrA_tag_degradation_assay About ssrA-tag, http://2015.igem.org/Team:Tokyo_Tech/Experiment/Overview_of_fim_inversion_system About ''fim'' inversion system
Applications of BBa_K1632000
User Reviews
UNIQ456faad417f63eab-partinfo-00000000-QINU UNIQ456faad417f63eab-partinfo-00000001-QINU